Last edited by Bataur
Wednesday, May 6, 2020 | History

2 edition of Study of InGaAs based MODEFET structures using variable angle spectroscopic ellipsometry found in the catalog.

Study of InGaAs based MODEFET structures using variable angle spectroscopic ellipsometry

Study of InGaAs based MODEFET structures using variable angle spectroscopic ellipsometry

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  • 25 Currently reading

Published by National Aeronautics and Space Administration, For sale by the National Technical Information Service in [Washington, DC], [Springfield, Va .
Written in English

    Subjects:
  • Ellipsometry.

  • Edition Notes

    StatementS.A. Alterovitz ... [et al.].
    SeriesNASA technical memorandum -- 103792.
    ContributionsAlterovitz, Samuel A., United States. National Aeronautics and Space Administration.
    The Physical Object
    FormatMicroform
    Pagination1 v.
    ID Numbers
    Open LibraryOL15393941M


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Study of InGaAs based MODEFET structures using variable angle spectroscopic ellipsometry Download PDF EPUB FB2

Get this from a library. Study of InGaAs based MODEFET structures using variable angle spectroscopic ellipsometry. [Samuel A Alterovitz; United States. National Aeronautics and Space Administration.;].

Ellipsometry and polarized light. Amsterdam ; New York: New York: North-Holland Pub. ; sole distributors for the U.S.A. and Canada, Elsevier North-Holland Study of InGaAs based MODEFET structures using variable angle spectroscopic ellipsometry [microform] / S Ellipsometric study of InGaAs MODFET material [microform] / S.A.

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